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Nancy L. Michael, Ph.D.
Senior Lecturer
ME Undergraduate Advisor
Education: Ph.D. University of Texas at Arlington, M. S. M. S. E., University of Texas at Arlington, B. S. Cer. E., Iowa State University
Areas of Expertise: Electronic materials, integrated circuit interconnect technology, materials characterization, (SEM, XRD, AES, XPS).
Background: Dr. Michael has research experience in reliability of interconnects (including Cu, Al, and Low-k dielectric materials), copper and low-k dielectric integration issues, copper resistivity, and barrier effectiveness as IC feature size decreases. Dr. Michael is a member of TMS, active in symposium organizing, and her work has been published in various refereed journals as well as conference proceedings.
Email: michael@uta.edu
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